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Reduction of UV-Induced Damage Using a Controllable Electron Temperature Plasma Source
- Authors
- 정진욱
- Issue Date
- 14-Oct-2025
- Place
- COEX Convention & Exhibition Center, Seoul, Republic of Korea
- Conference Name
- 78th Gaseous Electronics Conference (2025 GEC)
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Collections - 서울 공과대학 > 서울 전기공학전공 > 2. Conference Papers
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Related Researcher
- Chung, Chin Wook
- COLLEGE OF ENGINEERING (MAJOR IN ELECTRICAL ENGINEERING)