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Bridging the p-type gap in oxide electronics with 2D semiconductors
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Taikyu | - |
| dc.contributor.author | Hwang, Seokhyun | - |
| dc.contributor.author | Jeong, Jae Kyeong | - |
| dc.date.accessioned | 2026-07-15T05:30:11Z | - |
| dc.date.available | 2026-07-15T05:30:11Z | - |
| dc.date.issued | 2026-07 | - |
| dc.identifier.issn | 2731-3395 | - |
| dc.identifier.issn | 2731-3395 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/219162 | - |
| dc.description.abstract | Monolithic three-dimensional (3D) integration—collocating logic and memory in the back-end-of-line (BEOL)—offers higher bandwidth, lower latency, and improved energy efficiency for AI, cloud, and edge systems. Pairing two-dimensional p-type semiconductors with oxide n-channel transistors establishes a practical basis for complementary BEOL CMOS. This Review assesses manufacturing-aligned pathways to high-performance 2D p-channel transistors, covering transfer-free low-temperature growth, clean van der Waals contacts, gentle p-doping, and mitigation of crystallization, volatility, and interdiffusion. Recent gain-cell and vertical complementary field-effect transistor (CFET) demonstrations are examined, and a pragmatic outlook for BEOL p-type 2D semiconductors is outlined toward manufacturable, dense, low-power monolithic 3D chips. | - |
| dc.format.extent | 14 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | SPRINGERNATURE | - |
| dc.title | Bridging the p-type gap in oxide electronics with 2D semiconductors | - |
| dc.type | Article | - |
| dc.publisher.location | 영국 | - |
| dc.identifier.doi | 10.1038/s44172-026-00723-3 | - |
| dc.identifier.scopusid | 2-s2.0-105044020218 | - |
| dc.identifier.wosid | 001813662400001 | - |
| dc.identifier.bibliographicCitation | COMMUNICATIONS ENGINEERING, v.5, no.1, pp 1 - 14 | - |
| dc.citation.title | COMMUNICATIONS ENGINEERING | - |
| dc.citation.volume | 5 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 14 | - |
| dc.type.docType | Review | - |
| dc.description.isOpenAccess | Y | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.description.journalRegisteredClass | esci | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Multidisciplinary | - |
| dc.subject.keywordPlus | FIELD-EFFECT TRANSISTORS | - |
| dc.subject.keywordPlus | THIN-FILM TRANSISTORS | - |
| dc.subject.keywordPlus | 3-DIMENSIONAL INTEGRATION | - |
| dc.subject.keywordPlus | TELLURIUM | - |
| dc.subject.keywordPlus | TEMPERATURE | - |
| dc.subject.keywordPlus | VOLTAGE | - |
| dc.subject.keywordPlus | OXYGEN | - |
| dc.subject.keywordPlus | IN2O3 | - |
| dc.identifier.url | https://www.nature.com/articles/s44172-026-00723-3 | - |
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