Secure Integrated Circuit with Physical Attack Detection based on Reconfigurable Top Metal Shield
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Mun, Yeongjin | - |
dc.contributor.author | Kim, Hyungseup | - |
dc.contributor.author | Lee, Byeoncheol | - |
dc.contributor.author | Han, Kwonsang | - |
dc.contributor.author | Kim, Jaesung | - |
dc.contributor.author | Kim, Ji-Hoon | - |
dc.contributor.author | CHOI, BYONG DEOK | - |
dc.contributor.author | Kim, Dong Kyue | - |
dc.contributor.author | Ko, Hyoungho | - |
dc.date.accessioned | 2021-07-30T04:56:05Z | - |
dc.date.available | 2021-07-30T04:56:05Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2019-06 | - |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/2199 | - |
dc.description.abstract | Invasive physical attacks on integrated circuits (ICs), such as de-packaging, focused ion beam (FIB) chip editing, and micro-probing attempts, constitute security threats for chips with potentially valuable information, such as smart cards. Using a state-of-the-art circuit-editing technique, an attacker can remove an IC's top metal layer, leaving its secure information exposed to micro-probing attacks. Security ICs can be seriously threatened by such attacks and thus require on-chip countermeasures. Conventional active shields, however, have difficulty coping with physical attacks based on FIB chip editing (i.e., bypassing the top metal shield). This study presents a novel countermeasure against physical attacks based on the use of a reconfigurable metal shield for both top metal removal and micro-probing attack detection. This shield consists of two circuits: an FIB chip editing detection circuit consisting of a random number generator and a micro-probing attempt detection circuit consisting of two conditionally synchronized ring oscillators. Both circuits share a randomly reconfigured top metal shield, which represents a promising solution for security against state-of-the-art invasive attacks. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IEEK PUBLICATION CENTER | - |
dc.title | Secure Integrated Circuit with Physical Attack Detection based on Reconfigurable Top Metal Shield | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | CHOI, BYONG DEOK | - |
dc.identifier.doi | 10.5573/JSTS.2019.19.3.260 | - |
dc.identifier.scopusid | 2-s2.0-85070531102 | - |
dc.identifier.wosid | 000472481900004 | - |
dc.identifier.bibliographicCitation | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.19, no.3, pp.260 - 269 | - |
dc.relation.isPartOf | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.citation.title | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.citation.volume | 19 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 260 | - |
dc.citation.endPage | 269 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | Chip scale packages | - |
dc.subject.keywordPlus | Detector circuits | - |
dc.subject.keywordPlus | Hardware security | - |
dc.subject.keywordPlus | Integrated circuits | - |
dc.subject.keywordPlus | Ion beams | - |
dc.subject.keywordPlus | Metals | - |
dc.subject.keywordPlus | Number theory | - |
dc.subject.keywordPlus | Random number generation | - |
dc.subject.keywordPlus | Reconfigurable hardware | - |
dc.subject.keywordPlus | Smart cards | - |
dc.subject.keywordPlus | Timing circuits | - |
dc.subject.keywordPlus | Active shields | - |
dc.subject.keywordPlus | Attack detection | - |
dc.subject.keywordPlus | Detection circuits | - |
dc.subject.keywordPlus | Integrated circuits (ICs) | - |
dc.subject.keywordPlus | Invasive attack | - |
dc.subject.keywordPlus | Micro-probing attempt | - |
dc.subject.keywordPlus | Random number generators | - |
dc.subject.keywordPlus | Security threats | - |
dc.subject.keywordPlus | Oscillators (electronic) | - |
dc.subject.keywordAuthor | Terms-Active shield | - |
dc.subject.keywordAuthor | hardware security | - |
dc.subject.keywordAuthor | invasive attack | - |
dc.subject.keywordAuthor | micro-probing attempt | - |
dc.subject.keywordAuthor | top metal shield | - |
dc.identifier.url | https://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE08746100&language=ko_KR&hasTopBanner=true | - |
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