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Electrical diagnostic method on electron temperatureand ion density using the self-bias effect
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정진욱 | - |
| dc.date.accessioned | 2021-08-02T17:00:10Z | - |
| dc.date.available | 2021-08-02T17:00:10Z | - |
| dc.date.created | 2021-06-30 | - |
| dc.date.issued | 2018-11-07 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/23797 | - |
| dc.publisher | American Physical Society | - |
| dc.title | Electrical diagnostic method on electron temperatureand ion density using the self-bias effect | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 정진욱 | - |
| dc.identifier.bibliographicCitation | Gaseous Electronics Conference | - |
| dc.relation.isPartOf | Gaseous Electronics Conference | - |
| dc.citation.title | Gaseous Electronics Conference | - |
| dc.citation.conferencePlace | Oragon convention center, Portland | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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Collections - 서울 공과대학 > 서울 전기공학전공 > 2. Conference Papers
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Related Researcher
- Chung, Chin Wook
- COLLEGE OF ENGINEERING (MAJOR IN ELECTRICAL ENGINEERING)