Electrical wire explosion process of copper/silver hybrid nano-particle ink and its sintering via flash white light to achieve high electrical conductivity
DC Field | Value | Language |
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dc.contributor.author | Chung, Wan-Ho | - |
dc.contributor.author | Hwang, Yeon-Taek | - |
dc.contributor.author | Lee, Seung-Hyun | - |
dc.contributor.author | Kim, Hak-Sung | - |
dc.date.accessioned | 2021-08-02T17:26:27Z | - |
dc.date.available | 2021-08-02T17:26:27Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2016-04 | - |
dc.identifier.issn | 0957-4484 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/23842 | - |
dc.description.abstract | In this work, combined silver/copper nanoparticles were fabricated by the electrical explosion of a metal wire. In this method, a high electrical current passes through the metal wire with a high voltage. Consequently, the metal wire evaporates and metal nanoparticles are formed. The diameters of the silver and copper nanoparticles were controlled by changing the voltage conditions. The fabricated silver and copper nano-inks were printed on a flexible polyimide (PI) substrate and sintered at room temperature via a flash light process, using a xenon lamp and varying the light energy. The microstructures of the sintered silver and copper films were observed using a scanning electron microscope (SEM) and a transmission electron microscope (TEM). To investigate the crystal phases of the flash-light-sintered silver and copper films, x-ray diffraction (XRD) was performed. The absorption wavelengths of the silver and copper nanoinks were measured using ultraviolet-visible spectroscopy (UV-vis). Furthermore, the resistivity of the sintered silver and copper films was measured using the four-point probe method and an alpha step. As a result, the fabricated Cu/Ag film shows a high electrical conductivity (4.06 μΩcm), which is comparable to the resistivity of bulk copper (1.68 μΩcm). In addition, the fabricated Cu/Ag nanoparticle film shows superior oxidation stability compared to the Cu nanoparticle film. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.title | Electrical wire explosion process of copper/silver hybrid nano-particle ink and its sintering via flash white light to achieve high electrical conductivity | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Hak-Sung | - |
dc.identifier.doi | 10.1088/0957-4484/27/20/205704 | - |
dc.identifier.scopusid | 2-s2.0-84964343857 | - |
dc.identifier.wosid | 000374010800020 | - |
dc.identifier.bibliographicCitation | NANOTECHNOLOGY, v.27, no.20, pp.1 - 13 | - |
dc.relation.isPartOf | NANOTECHNOLOGY | - |
dc.citation.title | NANOTECHNOLOGY | - |
dc.citation.volume | 27 | - |
dc.citation.number | 20 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 13 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | COPPER NANOPARTICLES | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | ELECTRONICS | - |
dc.subject.keywordPlus | ACETYLIDE | - |
dc.subject.keywordPlus | CIRCUITS | - |
dc.subject.keywordAuthor | copper and silver nano-ink | - |
dc.subject.keywordAuthor | wire explosion | - |
dc.subject.keywordAuthor | flash light sintering | - |
dc.subject.keywordAuthor | low porosity | - |
dc.subject.keywordAuthor | printed electronics | - |
dc.identifier.url | https://iopscience.iop.org/article/10.1088/0957-4484/27/20/205704 | - |
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