Cited 33 time in
Two-step flash light sintering process for enhanced adhesion between copper complex ion/silane ink and a flexible substrate
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jeon, Eun-Beom | - |
| dc.contributor.author | Joo, Sung-Jun | - |
| dc.contributor.author | Ahn, Heejoon | - |
| dc.contributor.author | Kim, Hak-Sung | - |
| dc.date.accessioned | 2021-08-02T17:30:18Z | - |
| dc.date.available | 2021-08-02T17:30:18Z | - |
| dc.date.issued | 2016-03 | - |
| dc.identifier.issn | 0040-6090 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/23936 | - |
| dc.description.abstract | A copper complex ion ink (including copper nanoparticles, a copper precursor and a silane coupling agent) was synthesized to enhance the adhesion between the copper pattern and a polyimide (PI) substrate. Oxygen plasma treatment was performed on the polyimide substrate to initiate a chemical reaction between the complex ion ink and the polyimide. Then, a two-step flash light sintering method (consisting of preheating and main sintering) was used to sinter the copper complex ion ink. The copper complex ion patterns were characterized as a function of the weight fraction of silane coupling agent using scanning electron microscopy (SEM), a four-point probe method and adhesion testing. In addition, a bending fatigue test was performed to evaluate the reliability of the conductive copper pattern under cyclic bending. The copper pattern fabricated with copper complex ion ink containing 3 wt% silane coupling agent exhibited the highest adhesion level (5B), the lowest resistivity (7.6 μΩ·cm) and a low resistance change (18%) after the bending fatigue test. The two-step sintering method used to enhance the adhesion between the copper complex ion ink and polyimide substrate was also studied using X-ray diffraction (XRD) and Fourier transform infrared spectroscopy (FT-IR). | - |
| dc.format.extent | 9 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Elsevier Sequoia | - |
| dc.title | Two-step flash light sintering process for enhanced adhesion between copper complex ion/silane ink and a flexible substrate | - |
| dc.type | Article | - |
| dc.publisher.location | 스위스 | - |
| dc.identifier.doi | 10.1016/j.tsf.2016.02.033 | - |
| dc.identifier.scopusid | 2-s2.0-84960415513 | - |
| dc.identifier.wosid | 000372794900062 | - |
| dc.identifier.bibliographicCitation | Thin Solid Films, v.603, pp 382 - 390 | - |
| dc.citation.title | Thin Solid Films | - |
| dc.citation.volume | 603 | - |
| dc.citation.startPage | 382 | - |
| dc.citation.endPage | 390 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
| dc.subject.keywordPlus | INTENSE PULSED-LIGHT | - |
| dc.subject.keywordPlus | PRINTED ELECTRONICS | - |
| dc.subject.keywordPlus | MOLECULAR-WEIGHT | - |
| dc.subject.keywordPlus | THIN-FILM | - |
| dc.subject.keywordPlus | NANOPARTICLES | - |
| dc.subject.keywordPlus | TEMPERATURE | - |
| dc.subject.keywordPlus | PATTERNS | - |
| dc.subject.keywordPlus | STABILITY | - |
| dc.subject.keywordPlus | POLYMER | - |
| dc.subject.keywordPlus | SILANE | - |
| dc.subject.keywordAuthor | Two-step sintering method | - |
| dc.subject.keywordAuthor | Flash light sintering | - |
| dc.subject.keywordAuthor | Copper nanoparticle | - |
| dc.subject.keywordAuthor | Copper precursor | - |
| dc.subject.keywordAuthor | Adhesion | - |
| dc.subject.keywordAuthor | Oxygen plasma | - |
| dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0040609016001322?via%3Dihub | - |
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