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Partial row address prefetch and auto-activate using precharge command for high density DRAM

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dc.contributor.authorLee, M. -K.-
dc.contributor.authorChung, Ki Seok-
dc.date.accessioned2021-07-30T05:00:48Z-
dc.date.available2021-07-30T05:00:48Z-
dc.date.created2021-05-11-
dc.date.issued2019-01-
dc.identifier.issn0013-5194-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/2645-
dc.description.abstractDynamic RAM (DRAM) is mainly used as the main memory. As the DRAM density increases, the address bus width required for a DRAM device is also increased. However, in a high-speed DRAM interface, as the address bus becomes wider, not only the routing area and power consumption increase but also the timing margin to maintain signal integrity also decreases. Furthermore, without increasing the address bus pins, row addressing may need multiple cycles, which will lead to significant performance degradation. In this Letter, the authors propose a novel row addressing scheme to issue single-cycle row addressing without extra address bus pins for high-density DRAM devices. The proposed scheme prefetches a part of the target row address for the next activate command using unused address bus of a precharge command. The proposed scheme also enables an auto-activate operation which activates automatically after precharge without explicitly issuing an activate command. As a result, the proposed row addressing scheme reduces the performance degradation due to multi-cycle row addressing and the power consumption on the memory bus due to explicit activate command.-
dc.language영어-
dc.language.isoen-
dc.publisherINST ENGINEERING TECHNOLOGY-IET-
dc.titlePartial row address prefetch and auto-activate using precharge command for high density DRAM-
dc.typeArticle-
dc.contributor.affiliatedAuthorChung, Ki Seok-
dc.identifier.doi10.1049/el.2018.7108-
dc.identifier.scopusid2-s2.0-85060108038-
dc.identifier.wosid000457283900009-
dc.identifier.bibliographicCitationELECTRONICS LETTERS, v.55, no.2, pp.76 - 78-
dc.relation.isPartOfELECTRONICS LETTERS-
dc.citation.titleELECTRONICS LETTERS-
dc.citation.volume55-
dc.citation.number2-
dc.citation.startPage76-
dc.citation.endPage78-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusBusbars-
dc.subject.keywordPlusElectric power utilization-
dc.subject.keywordPlusAddressing scheme-
dc.subject.keywordPlusHigh speed DRAMs-
dc.subject.keywordPlusMultiple cycles-
dc.subject.keywordPlusPerformance degradation-
dc.subject.keywordPlusRouting area-
dc.subject.keywordPlusSignal Integrity-
dc.subject.keywordPlusSingle cycle-
dc.subject.keywordPlusTiming margin-
dc.subject.keywordPlusDynamic random access storage-
dc.subject.keywordAuthorsystem buses-
dc.subject.keywordAuthorstorage management-
dc.subject.keywordAuthorDRAM chips-
dc.subject.keywordAuthorsignificant performance degradation-
dc.subject.keywordAuthornovel row-
dc.subject.keywordAuthorsingle-cycle row-
dc.subject.keywordAuthorextra address bus pins-
dc.subject.keywordAuthorhigh-density DRAM devices-
dc.subject.keywordAuthortarget row address-
dc.subject.keywordAuthorunused address bus-
dc.subject.keywordAuthorprecharge command-
dc.subject.keywordAuthorauto-activate operation-
dc.subject.keywordAuthorrow addressing scheme-
dc.subject.keywordAuthormulticycle row addressing-
dc.subject.keywordAuthormemory bus-
dc.subject.keywordAuthorexplicit activate command-
dc.subject.keywordAuthorhigh density DRAM-
dc.subject.keywordAuthordynamic RAM-
dc.subject.keywordAuthormain memory-
dc.subject.keywordAuthorDRAM density increases-
dc.subject.keywordAuthoraddress bus width-
dc.subject.keywordAuthorDRAM device-
dc.subject.keywordAuthorhigh-speed DRAM interface-
dc.subject.keywordAuthorpower consumption increase-
dc.subject.keywordAuthormultiple cycles-
dc.identifier.urlhttps://ietresearch.onlinelibrary.wiley.com/doi/10.1049/el.2018.7108-
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