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Self-heating effect on the electrical characteristics of n-MOS and p-MOS strained Si FinFETs
- Authors
- 김태환
- Issue Date
- 12-Jul-2018
- Publisher
- Korea Nano Technology Research Society
- Citation
- NANO KOREA 2018
- Conference Name
- NANO KOREA 2018
- Place
- 킨텍스
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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