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In-Core Power Measurement Using SiC Semiconductor Detector

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dc.contributor.authorPark, Junesic-
dc.contributor.authorSon, Jaebum-
dc.contributor.authorKim, Yong Kyun-
dc.contributor.authorPark, Se Hwan-
dc.date.accessioned2021-07-30T05:05:34Z-
dc.date.available2021-07-30T05:05:34Z-
dc.date.created2021-05-12-
dc.date.issued2020-02-
dc.identifier.issn0374-4884-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/2849-
dc.description.abstractA SiC detector was fabricated and tested in harsh radiation environment of the High Flux Advanced Neutron Application Reactor (HANARO) reactor core at Korea Atomic Energy Research Institute (KAERI). A 4H-SiC with 30 mu m thick epitaxial layer was used as the radiation sensor, and the detector was designed to be tolerable against thermal and radiation damages. Alpha response and I-V characteristics of fabricated SiC sensor was measured and detection performance of the SiC detector was evaluated in a neutron field of HANARO ex-core neutron irradiation facility. After preliminary tests, reactor power monitoring using the SiC detector was carried out by inserting it into the HANARO irradiation hole, IP-4. Radiation-induced current of the detector was recorded as reactor power increased up to 10 MWth. Maximum thermal and fast neutron fluxes were 9.4x10(12) and 2.5x10(9) neutrons/cm(2)/sec, respectively, and total neutron fluence irradiated on the detector was 4.7x10(16) neutrons/cm(2). The detector showed good linearity of response up to the tested fluence, with R-2 = 0.9997. Response speed of SiC detector was compared to that of a Rh self-powered neutron detector (SPND) in terms of signal saturation time. Averaged SiC detector saturation time was 12.8 seconds, approximately 11 times faster that of the Rh SPND.-
dc.language영어-
dc.language.isoen-
dc.publisherKOREAN PHYSICAL SOC-
dc.titleIn-Core Power Measurement Using SiC Semiconductor Detector-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Yong Kyun-
dc.identifier.doi10.3938/jkps.76.306-
dc.identifier.wosid000515170400007-
dc.identifier.bibliographicCitationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.76, no.4, pp.306 - 310-
dc.relation.isPartOfJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.titleJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.volume76-
dc.citation.number4-
dc.citation.startPage306-
dc.citation.endPage310-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.identifier.kciidART002560029-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Multidisciplinary-
dc.subject.keywordPlusFAST-NEUTRON DETECTION-
dc.subject.keywordPlusRADIATION TOLERANCE-
dc.subject.keywordPlusCARBIDE-
dc.subject.keywordPlusIRRADIATION-
dc.subject.keywordPlusREACTOR-
dc.subject.keywordAuthorSilicon carbide-
dc.subject.keywordAuthorSemiconductor detector-
dc.subject.keywordAuthorIn-core detector-
dc.subject.keywordAuthorIn-core experiment-
dc.subject.keywordAuthorRadiation damage-
dc.identifier.urlhttps://link.springer.com/article/10.3938/jkps.76.306-
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