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Effect of Oxide-Nitride-Oxide Thickness on Coupling Ratio and Back Tunneling in NAND Flash Memories
- Authors
- 박재근
- Issue Date
- 25-Oct-2017
- Place
- 경주화백컨벤션센터
- Conference Name
- 2017 가을 학술논문발표회 및 임시총회(2017 KPS Fall Meeting)
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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