Analysis of X-ray spectra in 14.5-GHz ECR ion source for optimizing operation conditions
DC Field | Value | Language |
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dc.contributor.author | Lee, Cheol Ho | - |
dc.contributor.author | Chang, Dae Sik | - |
dc.contributor.author | Oh, Byung Hoon | - |
dc.contributor.author | Kim, Yong Kyun | - |
dc.date.accessioned | 2021-07-30T05:08:46Z | - |
dc.date.available | 2021-07-30T05:08:46Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2016-06 | - |
dc.identifier.issn | 0022-3131 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/3234 | - |
dc.description.abstract | An electron cyclotron resonance (ECR) ion source operating at 14.5 GHz was developed for the generation of charged ions at the Korea Atomic Energy Research Institute (KAERI). Experiments were carried out to study the plasma inside the ECR ion source by analyzing the X-ray spectra generated by it. The X-ray energy distribution and electron energy inside the plasma chamber are influenced by the status of the heated plasma. That status depends on various operation parameters such as microwave power, injected gas-pressure, and solenoid and trim coil currents. X-ray spectra were recorded to find the correlation between the plasma and the X-rays for variations in the operation parameters. A standard NaI(Tl) detector was used for that purpose. The X-ray energy distribution was studied in the range of 100-500 W for radiofrequency power. The influence of the injected gas pressure and the mirror ratio in the emission of X-rays were analyzed. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | TAYLOR & FRANCIS LTD | - |
dc.title | Analysis of X-ray spectra in 14.5-GHz ECR ion source for optimizing operation conditions | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Yong Kyun | - |
dc.identifier.doi | 10.1080/00223131.2016.1195303 | - |
dc.identifier.scopusid | 2-s2.0-84975109882 | - |
dc.identifier.wosid | 000386383300019 | - |
dc.identifier.bibliographicCitation | JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, v.53, no.12, pp.2072 - 2078 | - |
dc.relation.isPartOf | JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY | - |
dc.citation.title | JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY | - |
dc.citation.volume | 53 | - |
dc.citation.number | 12 | - |
dc.citation.startPage | 2072 | - |
dc.citation.endPage | 2078 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | Y | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Nuclear Science & Technology | - |
dc.relation.journalWebOfScienceCategory | Nuclear Science & Technology | - |
dc.subject.keywordPlus | Cyclotrons | - |
dc.subject.keywordPlus | Electron energy levels | - |
dc.subject.keywordPlus | Electron temperature | - |
dc.subject.keywordPlus | Electrons | - |
dc.subject.keywordPlus | Ion sources | - |
dc.subject.keywordPlus | Particle accelerators | - |
dc.subject.keywordPlus | Plasma diagnostics | - |
dc.subject.keywordPlus | Plasmas | - |
dc.subject.keywordPlus | X ray analysis | - |
dc.subject.keywordPlus | X ray spectrographs | - |
dc.subject.keywordPlus | X rays | - |
dc.subject.keywordAuthor | X-ray | - |
dc.subject.keywordAuthor | accelerator | - |
dc.subject.keywordAuthor | analysis | - |
dc.subject.keywordAuthor | ECR ion source | - |
dc.subject.keywordAuthor | X-ray spectra | - |
dc.subject.keywordAuthor | NaI(Tl) detector | - |
dc.subject.keywordAuthor | plasma | - |
dc.subject.keywordAuthor | electron temperature | - |
dc.subject.keywordAuthor | electron confinement time | - |
dc.identifier.url | https://www.tandfonline.com/doi/full/10.1080/00223131.2016.1195303 | - |
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