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Change Characteristics of the CB-RAM According to the Thickness of HfOx Insulator and Heat Treatment Temperature
- Authors
- 박재근
- Issue Date
- 17-Nov-2016
- Place
- 경주 현대호텔
- Conference Name
- 2016년도 한국재료학회 추계학술대회
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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