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수소 이온 주입 에너지 및 후속 열처리 조건에 따른 Si Wafer 내부 Cleavage 형성 영향

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dc.contributor.author최창환-
dc.date.accessioned2021-08-03T06:33:13Z-
dc.date.available2021-08-03T06:33:13Z-
dc.date.issued2016-04-28-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/36885-
dc.title수소 이온 주입 에너지 및 후속 열처리 조건에 따른 Si Wafer 내부 Cleavage 형성 영향-
dc.typeConference-
dc.citation.conferenceName대한금속재료학회 춘계학술대회-
dc.citation.conferencePlace경주화백컨벤션센터-
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서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers

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