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Improvement in high mobility of top gate zinc tin oxide transistor by metal capping method

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dc.contributor.author정재경-
dc.date.accessioned2021-08-03T06:42:53Z-
dc.date.available2021-08-03T06:42:53Z-
dc.date.issued2016-02-24-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/37462-
dc.titleImprovement in high mobility of top gate zinc tin oxide transistor by metal capping method-
dc.typeConference-
dc.citation.conferenceName한국반도체학술대회-
dc.citation.conferencePlace강원도 하이원리조트-
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서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers

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Jeong, Jae Kyeong
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
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