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Thermal Impact on Reliability Degradation of Magnetic Tunnel Junction with Mgo Barrier
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 송윤흡 | - |
| dc.date.accessioned | 2021-08-03T07:26:34Z | - |
| dc.date.available | 2021-08-03T07:26:34Z | - |
| dc.date.issued | 2015-07-01 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/39692 | - |
| dc.title | Thermal Impact on Reliability Degradation of Magnetic Tunnel Junction with Mgo Barrier | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | International Conference on Materials for Advanced Technologies of the Materials Reseach Society of Singapore & 16th IUMRS-International Conference in Asia (ICMAT2015&IUMRS-ICA2015) | - |
| dc.citation.conferencePlace | Suntec Singapore | - |
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Song, Yun Heub
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)