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Thermal Impact on Reliability Degradation of Magnetic Tunnel Junction with Mgo Barrier
- Authors
- 송윤흡
- Issue Date
- 1-Jul-2015
- Place
- Suntec Singapore
- Conference Name
- International Conference on Materials for Advanced Technologies of the Materials Reseach Society of Singapore & 16th IUMRS-International Conference in Asia (ICMAT2015&IUMRS-ICA2015)
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Song, Yun Heub
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)