Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Thermal Degradation effect on electrical characteristics of SnS2 thin film transistors
- Authors
- 이승백
- Issue Date
- 1-Jul-2015
- Publisher
- 나노기술연구협의회
- Citation
- The 13th international Nanotech Symposium
- Conference Name
- The 13th international Nanotech Symposium
- Place
- Coex, Seoul
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Lee, Seung Beck
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)