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Detectability of Distributed Defects According to Synthetic Aperture Imaging Algorithm
- Authors
- 장경영
- Issue Date
- 31-Jul-2015
- Place
- Minneapolis,Minnesota
- Conference Name
- 42nd Annual Review of Progress in Quantitative Nondestructive Evaluation Conference
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Collections - 서울 공과대학 > 서울 기계공학부 > 2. Conference Papers
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