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Stability of Amorphous in-Ga-Zn-O Thin Film Transistors with Silicon-Doped Back-Channel Layer under Temperature Humidity Stresses
- Authors
- 박재근
- Issue Date
- 7-Oct-2014
- Place
- Moon Palace Resort
- Conference Name
- 226th ECS Meeting
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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