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Effects of vertical thickness scaling on the interlayer disturbance in 3D SONOS NAND Flash memory
- Authors
- 이승백
- Issue Date
- 2-Jul-2014
- Place
- Seoul, Korea
- Conference Name
- The 12th international nanotech conference and nano-convergence expo
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Lee, Seung Beck
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)