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Design of Extremely Proximity Gettering using MeV-nitrogen Ion Implantation for Si C-MOS Image Sensor
- Authors
- 박재근
- Issue Date
- 8-May-2014
- Place
- The University of Texas at Dallas
- Conference Name
- 2014 SiWEDS Spring Meeting
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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