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Leakage Control System Using Data Estimation of Resistive Memory

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dc.contributor.authorKweon, JunYoung-
dc.contributor.authorChoi, JunTae-
dc.contributor.authorSong, Yun-Heup-
dc.contributor.authorKim, Tony Tae-Hyoung-
dc.date.accessioned2021-07-30T05:24:23Z-
dc.date.available2021-07-30T05:24:23Z-
dc.date.created2021-05-11-
dc.date.issued2019-02-
dc.identifier.issn2163-9612-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/4616-
dc.description.abstractIn this work, we present a data-aware read sneak current control technique for improving sensing margins in cross-point (X-point) resistive memories. We introduce a novel method of estimating resistive memory data distribution. The result from this estimation is utilized for determining adequate bias condition for reliable read operation. The adjusted bias condition will realize constant leakage current, which facilitates reliable sensing regardless of the data distribution in the resistive memory array.-
dc.language영어-
dc.language.isoen-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleLeakage Control System Using Data Estimation of Resistive Memory-
dc.typeArticle-
dc.contributor.affiliatedAuthorSong, Yun-Heup-
dc.identifier.doi10.1109/ISOCC.2018.8649917-
dc.identifier.scopusid2-s2.0-85063227939-
dc.identifier.wosid000462769800074-
dc.identifier.bibliographicCitationProceedings - International SoC Design Conference 2018, ISOCC 2018, pp.196 - 197-
dc.relation.isPartOfProceedings - International SoC Design Conference 2018, ISOCC 2018-
dc.citation.titleProceedings - International SoC Design Conference 2018, ISOCC 2018-
dc.citation.startPage196-
dc.citation.endPage197-
dc.type.rimsART-
dc.type.docTypeConference Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryComputer Science, Hardware & Architecture-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusBias conditions-
dc.subject.keywordPlusData distribution-
dc.subject.keywordPlusData estimation-
dc.subject.keywordPlusLeakage control-
dc.subject.keywordPlusLeakage control system-
dc.subject.keywordPlusResistive memory-
dc.subject.keywordPlusSensing margin-
dc.subject.keywordPlusX-point-
dc.subject.keywordAuthorLeakage control-
dc.subject.keywordAuthorResistive memory-
dc.subject.keywordAuthorX-point-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8649917-
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