Leakage Control System Using Data Estimation of Resistive Memory
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kweon, JunYoung | - |
dc.contributor.author | Choi, JunTae | - |
dc.contributor.author | Song, Yun-Heup | - |
dc.contributor.author | Kim, Tony Tae-Hyoung | - |
dc.date.accessioned | 2021-07-30T05:24:23Z | - |
dc.date.available | 2021-07-30T05:24:23Z | - |
dc.date.created | 2021-05-11 | - |
dc.date.issued | 2019-02 | - |
dc.identifier.issn | 2163-9612 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/4616 | - |
dc.description.abstract | In this work, we present a data-aware read sneak current control technique for improving sensing margins in cross-point (X-point) resistive memories. We introduce a novel method of estimating resistive memory data distribution. The result from this estimation is utilized for determining adequate bias condition for reliable read operation. The adjusted bias condition will realize constant leakage current, which facilitates reliable sensing regardless of the data distribution in the resistive memory array. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Leakage Control System Using Data Estimation of Resistive Memory | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Song, Yun-Heup | - |
dc.identifier.doi | 10.1109/ISOCC.2018.8649917 | - |
dc.identifier.scopusid | 2-s2.0-85063227939 | - |
dc.identifier.wosid | 000462769800074 | - |
dc.identifier.bibliographicCitation | Proceedings - International SoC Design Conference 2018, ISOCC 2018, pp.196 - 197 | - |
dc.relation.isPartOf | Proceedings - International SoC Design Conference 2018, ISOCC 2018 | - |
dc.citation.title | Proceedings - International SoC Design Conference 2018, ISOCC 2018 | - |
dc.citation.startPage | 196 | - |
dc.citation.endPage | 197 | - |
dc.type.rims | ART | - |
dc.type.docType | Conference Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Computer Science | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Computer Science, Hardware & Architecture | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.subject.keywordPlus | Bias conditions | - |
dc.subject.keywordPlus | Data distribution | - |
dc.subject.keywordPlus | Data estimation | - |
dc.subject.keywordPlus | Leakage control | - |
dc.subject.keywordPlus | Leakage control system | - |
dc.subject.keywordPlus | Resistive memory | - |
dc.subject.keywordPlus | Sensing margin | - |
dc.subject.keywordPlus | X-point | - |
dc.subject.keywordAuthor | Leakage control | - |
dc.subject.keywordAuthor | Resistive memory | - |
dc.subject.keywordAuthor | X-point | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/8649917 | - |
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