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Leakage Control System Using Data Estimation of Resistive Memory

Authors
Kweon, JunYoungChoi, JunTaeSong, Yun-HeupKim, Tony Tae-Hyoung
Issue Date
Feb-2019
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
Leakage control; Resistive memory; X-point
Citation
Proceedings - International SoC Design Conference 2018, ISOCC 2018, pp.196 - 197
Indexed
SCOPUS
Journal Title
Proceedings - International SoC Design Conference 2018, ISOCC 2018
Start Page
196
End Page
197
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/4616
DOI
10.1109/ISOCC.2018.8649917
ISSN
2163-9612
Abstract
In this work, we present a data-aware read sneak current control technique for improving sensing margins in cross-point (X-point) resistive memories. We introduce a novel method of estimating resistive memory data distribution. The result from this estimation is utilized for determining adequate bias condition for reliable read operation. The adjusted bias condition will realize constant leakage current, which facilitates reliable sensing regardless of the data distribution in the resistive memory array.
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서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles

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