Leakage Control System Using Data Estimation of Resistive Memory
- Authors
- Kweon, JunYoung; Choi, JunTae; Song, Yun-Heup; Kim, Tony Tae-Hyoung
- Issue Date
- Feb-2019
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Keywords
- Leakage control; Resistive memory; X-point
- Citation
- Proceedings - International SoC Design Conference 2018, ISOCC 2018, pp.196 - 197
- Indexed
- SCOPUS
- Journal Title
- Proceedings - International SoC Design Conference 2018, ISOCC 2018
- Start Page
- 196
- End Page
- 197
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/4616
- DOI
- 10.1109/ISOCC.2018.8649917
- ISSN
- 2163-9612
- Abstract
- In this work, we present a data-aware read sneak current control technique for improving sensing margins in cross-point (X-point) resistive memories. We introduce a novel method of estimating resistive memory data distribution. The result from this estimation is utilized for determining adequate bias condition for reliable read operation. The adjusted bias condition will realize constant leakage current, which facilitates reliable sensing regardless of the data distribution in the resistive memory array.
- Files in This Item
-
Go to Link
- Appears in
Collections - 서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles
![qrcode](https://api.qrserver.com/v1/create-qr-code/?size=55x55&data=https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/4616)
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.