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Electrical Stability Enhancement of the Thin Film Transistor with the Back-channel Deposited by Co-sputtering Amorphous In-Ga-Zn-O and SiOx
- Authors
- 박재근
- Issue Date
- 30-Oct-2013
- Place
- Hilton San Francisco
- Conference Name
- 224th ECS Meeting
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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