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작은 샘플 크기의 One-shot Devices를 위한 베이지안 신뢰도 추정
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 배석주 | - |
| dc.date.accessioned | 2021-08-03T12:35:54Z | - |
| dc.date.available | 2021-08-03T12:35:54Z | - |
| dc.date.issued | 2013-05-24 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/48065 | - |
| dc.title | 작은 샘플 크기의 One-shot Devices를 위한 베이지안 신뢰도 추정 | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 한국경영과학회/대한산업공학회 춘계공동학술대회 | - |
| dc.citation.conferencePlace | 여수 | - |
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Collections - 서울 공과대학 > 서울 산업공학과 > 2. Conference Papers
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Related Researcher
- Bae, Suk Joo
- COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)