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작은 샘플 크기의 One-shot Devices를 위한 베이지안 신뢰도 추정

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dc.contributor.author배석주-
dc.date.accessioned2021-08-03T12:35:54Z-
dc.date.available2021-08-03T12:35:54Z-
dc.date.created2021-06-30-
dc.date.issued2013-05-24-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/48065-
dc.publisher대한산업공학회-
dc.title작은 샘플 크기의 One-shot Devices를 위한 베이지안 신뢰도 추정-
dc.typeConference-
dc.contributor.affiliatedAuthor배석주-
dc.identifier.bibliographicCitation한국경영과학회/대한산업공학회 춘계공동학술대회-
dc.relation.isPartOf한국경영과학회/대한산업공학회 춘계공동학술대회-
dc.citation.title한국경영과학회/대한산업공학회 춘계공동학술대회-
dc.citation.conferencePlace여수-
dc.type.rimsCONF-
dc.description.journalClass2-
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