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Effect on bias stress instability in amorphous In-Ga-Zn-O thin film transistors with annealing condition
- Authors
- 박재근
- Issue Date
- 25-Apr-2013
- Place
- 대전컨벤션센터
- Conference Name
- 한국물리학회 2013년 봄 학술논문발표회
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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