작은 샘플 크기의 one-shot device를 위한 베이지안 신뢰도 추정
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 배석주 | - |
dc.date.accessioned | 2021-08-03T13:34:20Z | - |
dc.date.available | 2021-08-03T13:34:20Z | - |
dc.date.created | 2021-06-30 | - |
dc.date.issued | 2012-11-23 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/49380 | - |
dc.publisher | 한국신뢰성학회 | - |
dc.title | 작은 샘플 크기의 one-shot device를 위한 베이지안 신뢰도 추정 | - |
dc.type | Conference | - |
dc.contributor.affiliatedAuthor | 배석주 | - |
dc.identifier.bibliographicCitation | 추계 신뢰성학회 | - |
dc.relation.isPartOf | 추계 신뢰성학회 | - |
dc.citation.title | 추계 신뢰성학회 | - |
dc.citation.conferencePlace | 한국뉴욕주립대학교 | - |
dc.type.rims | CONF | - |
dc.description.journalClass | 2 | - |
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