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Interface Improvement of ALD Al2O3 Gate Dielectric/6H-SiC Substrate by Hydrogenation Passivation Technique

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dc.contributor.author최창환-
dc.date.accessioned2021-08-03T15:18:13Z-
dc.date.available2021-08-03T15:18:13Z-
dc.date.created2021-06-30-
dc.date.issued2012-05-22-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/51738-
dc.publisherKIEEME, IEEK, KIM, MRS-
dc.titleInterface Improvement of ALD Al2O3 Gate Dielectric/6H-SiC Substrate by Hydrogenation Passivation Technique-
dc.typeConference-
dc.contributor.affiliatedAuthor최창환-
dc.identifier.bibliographicCitation16th International Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XVI)-
dc.relation.isPartOf16th International Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XVI)-
dc.citation.title16th International Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XVI)-
dc.citation.conferencePlaceBusan Bexco, Korea-
dc.type.rimsCONF-
dc.description.journalClass1-
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서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers

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