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Improvement in the bias stability of IGZO thin film transistors using Al2O3 buffer layer growth on Si3N4 dielectric layer
- Authors
- 전형탁
- Issue Date
- 20111027
- Place
- 신라대학교
- Conference Name
- 2011 한국재료학회 추계학술발표대회 및 제 21회 신소재 심포지엄
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Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
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Related Researcher
- Jeon, Hyeongtag
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)