Cited 0 time in
Design of Extreme Proximity Gettering for Advanced Semiconductor Devices Beyond 3X nm Technology - Understanding the dependency of Cu decoration on crystalline nature after device heat-treatment of 3X technology
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박재근 | - |
| dc.date.accessioned | 2021-08-03T17:34:17Z | - |
| dc.date.available | 2021-08-03T17:34:17Z | - |
| dc.date.issued | 2011-05-18 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/55319 | - |
| dc.title | Design of Extreme Proximity Gettering for Advanced Semiconductor Devices Beyond 3X nm Technology - Understanding the dependency of Cu decoration on crystalline nature after device heat-treatment of 3X technology | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2011 SiWEDS Spring Meeting | - |
| dc.citation.conferencePlace | University of Washington UW Tower | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366
COPYRIGHT © 2024 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
