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Design of Extreme Proximity Gettering for Advanced Semiconductor Devices Beyond 3X nm Technology - Understanding the dependency of Cu decoration on crystalline nature after device heat-treatment of 3X technology

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dc.contributor.author박재근-
dc.date.accessioned2021-08-03T17:34:17Z-
dc.date.available2021-08-03T17:34:17Z-
dc.date.issued2011-05-18-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/55319-
dc.titleDesign of Extreme Proximity Gettering for Advanced Semiconductor Devices Beyond 3X nm Technology - Understanding the dependency of Cu decoration on crystalline nature after device heat-treatment of 3X technology-
dc.typeConference-
dc.citation.conferenceName2011 SiWEDS Spring Meeting-
dc.citation.conferencePlaceUniversity of Washington UW Tower-
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서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers

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