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Analysis and Improvement of Reduced Charge Interference in 3-dimensional Vertical Gate NAND Flash Memory
- Authors
- 이승백
- Issue Date
- 18-Feb-2011
- Place
- 해비치호텔 & 리조트 제주
- Conference Name
- 제 18회 반도체 학술대회
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Lee, Seung Beck
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)