Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Retention Characteristics Dependent on the Trap Distribution of the Silicon Nitride Layer in TANOS Flash Memory Devices
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김태환 | - |
| dc.date.accessioned | 2021-08-03T17:53:34Z | - |
| dc.date.available | 2021-08-03T17:53:34Z | - |
| dc.date.created | 2021-06-30 | - |
| dc.date.issued | 2011-02-17 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/56113 | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | Retention Characteristics Dependent on the Trap Distribution of the Silicon Nitride Layer in TANOS Flash Memory Devices | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 김태환 | - |
| dc.identifier.bibliographicCitation | 2011년(18회) 한국반도체 학술대회 | - |
| dc.relation.isPartOf | 2011년(18회) 한국반도체 학술대회 | - |
| dc.citation.title | 2011년(18회) 한국반도체 학술대회 | - |
| dc.citation.conferencePlace | 해비치 호텔& 리조트 제주 ,Korea | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.