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New Evaluation Method for the Electrical Uniformity of Carbon Nanotube Thin-Film Using Non-Invasive Surface Contact Proving Technique
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이승백 | - |
| dc.date.accessioned | 2021-08-03T18:18:09Z | - |
| dc.date.available | 2021-08-03T18:18:09Z | - |
| dc.date.issued | 2011-01-17 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/56208 | - |
| dc.title | New Evaluation Method for the Electrical Uniformity of Carbon Nanotube Thin-Film Using Non-Invasive Surface Contact Proving Technique | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 제 16회 나노튜브 연구회 | - |
| dc.citation.conferencePlace | 용평리조트 | - |
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Lee, Seung Beck
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)