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New Evaluation Method for the Electrical Uniformity of Carbon Nanotube Thin-Film Using Non-Invasive Surface Contact Proving Technique

Authors
이승백
Issue Date
17-Jan-2011
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/56208
Place
용평리조트
Conference Name
제 16회 나노튜브 연구회
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서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers

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Lee, Seung Beck
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
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