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Growth and Characterization of High Quality a-plane InGaN/GaN Single Quantum Well Structure Grown by Multi-buffer Layer Technique

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dc.contributor.author김은규-
dc.date.accessioned2021-08-03T21:19:29Z-
dc.date.available2021-08-03T21:19:29Z-
dc.date.created2021-06-30-
dc.date.issued2009-10-08-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/60812-
dc.publisherThe Japan Society of Applied Physics-
dc.titleGrowth and Characterization of High Quality a-plane InGaN/GaN Single Quantum Well Structure Grown by Multi-buffer Layer Technique-
dc.typeConference-
dc.contributor.affiliatedAuthor김은규-
dc.identifier.bibliographicCitation2009 Inter. Conf. on Solid State Devices and Materials-
dc.relation.isPartOf2009 Inter. Conf. on Solid State Devices and Materials-
dc.citation.title2009 Inter. Conf. on Solid State Devices and Materials-
dc.citation.conferencePlaceSendai, Japan-
dc.type.rimsCONF-
dc.description.journalClass1-
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서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers

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