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NDT 검사용 CR 시스템의 특성
- Authors
- 김용균
- Issue Date
- 18-Sep-2009
- Place
- 한양대학교
- Conference Name
- 2009년도 첨단 NDT 기술 연구클러스터 기술세미나
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Collections - 서울 공과대학 > 서울 원자력공학과 > 2. Conference Papers
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Related Researcher
- Kim, Yong Kyun
- COLLEGE OF ENGINEERING (DEPARTMENT OF NUCLEAR ENGINEERING)