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Langmuir probe perturbation in inductively coupled plasmas

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dc.contributor.author정진욱-
dc.date.accessioned2021-08-03T23:23:36Z-
dc.date.available2021-08-03T23:23:36Z-
dc.date.created2021-06-30-
dc.date.issued2008-08-18-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/64135-
dc.publisher한국진공학회-
dc.titleLangmuir probe perturbation in inductively coupled plasmas-
dc.typeConference-
dc.contributor.affiliatedAuthor정진욱-
dc.identifier.bibliographicCitation1st International conference on microelectronics and plasma technology-
dc.relation.isPartOf1st International conference on microelectronics and plasma technology-
dc.citation.title1st International conference on microelectronics and plasma technology-
dc.citation.conferencePlaceJeju Ramada Plaza Hotel-
dc.type.rimsCONF-
dc.description.journalClass1-
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서울 공과대학 > 서울 전기공학전공 > 2. Conference Papers

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