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고 에너지 전자빔 조사된 n+-p와 n형 GaN의 결함구조 분석
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김은규 | - |
| dc.date.accessioned | 2021-08-04T00:22:38Z | - |
| dc.date.available | 2021-08-04T00:22:38Z | - |
| dc.date.created | 2021-06-30 | - |
| dc.date.issued | 2008-01-14 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/65536 | - |
| dc.publisher | 나노특화팹센터 | - |
| dc.title | 고 에너지 전자빔 조사된 n+-p와 n형 GaN의 결함구조 분석 | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 김은규 | - |
| dc.identifier.bibliographicCitation | 2nd Workshop on the Advanced Technologies of Nitride Semiconductors | - |
| dc.relation.isPartOf | 2nd Workshop on the Advanced Technologies of Nitride Semiconductors | - |
| dc.citation.title | 2nd Workshop on the Advanced Technologies of Nitride Semiconductors | - |
| dc.citation.conferencePlace | 나노특화팹센터 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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