Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
고 에너지 전자빔 조사된 n+-p와 n형 GaN의 결함구조 분석
- Authors
- 김은규
- Issue Date
- 14-Jan-2008
- Publisher
- 나노특화팹센터
- Citation
- 2nd Workshop on the Advanced Technologies of Nitride Semiconductors
- Conference Name
- 2nd Workshop on the Advanced Technologies of Nitride Semiconductors
- Place
- 나노특화팹센터
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.