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The Effect of Oxygen Vacancy on the Coerceive Field of Al-doped Hafnium Oxide Ferrroelectric Thin Film during Wake-Up Process

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dc.contributor.author최창환-
dc.date.accessioned2021-07-30T08:24:12Z-
dc.date.available2021-07-30T08:24:12Z-
dc.date.created2021-06-30-
dc.date.issued2020-11-23-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/6684-
dc.publisher한국세라믹학회-
dc.titleThe Effect of Oxygen Vacancy on the Coerceive Field of Al-doped Hafnium Oxide Ferrroelectric Thin Film during Wake-Up Process-
dc.typeConference-
dc.contributor.affiliatedAuthor최창환-
dc.identifier.bibliographicCitation한국세라믹학회 추계학술대회-
dc.relation.isPartOf한국세라믹학회 추계학술대회-
dc.citation.title한국세라믹학회 추계학술대회-
dc.citation.conferencePlace대전 DCC-
dc.type.rimsCONF-
dc.description.journalClass2-
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