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Electrostatic force microscopy measurements of charge trapping behaviors of Au nanoparticles embedded in metal-insulator-semiconductor structure
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 홍진표 | - |
| dc.date.accessioned | 2021-08-04T01:23:23Z | - |
| dc.date.available | 2021-08-04T01:23:23Z | - |
| dc.date.issued | 2007-06-10 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/67298 | - |
| dc.description.abstract | 1 | - |
| dc.title | Electrostatic force microscopy measurements of charge trapping behaviors of Au nanoparticles embedded in metal-insulator-semiconductor structure | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | International Scanning Probe Microscopy Conference 2007 | - |
| dc.citation.conferencePlace | Jeju | - |
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Hong, Jin Pyo
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)