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Angular Dependency of Off-axis Illumination on 100 nm-width Pattern Printability for Extreme Ultraviolet Lithography: Ru/Mo/Si Reflector System

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dc.contributor.author정용재-
dc.date.accessioned2021-08-04T05:54:39Z-
dc.date.available2021-08-04T05:54:39Z-
dc.date.created2021-06-30-
dc.date.issued2004-06-02-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/74506-
dc.publisherThe American Vacuum Society-
dc.titleAngular Dependency of Off-axis Illumination on 100 nm-width Pattern Printability for Extreme Ultraviolet Lithography: Ru/Mo/Si Reflector System-
dc.typeConference-
dc.contributor.affiliatedAuthor정용재-
dc.identifier.bibliographicCitationThe 48th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication-
dc.relation.isPartOfThe 48th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication-
dc.citation.titleThe 48th International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication-
dc.citation.conferencePlaceSan Diego, USA-
dc.type.rimsCONF-
dc.description.journalClass1-
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