Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Electrical Characterization of InAs/InP Self-Assembled Quantum Dots by Deep Level Transient Spectroscopy
- Authors
- 김은규
- Issue Date
- 30-Oct-2003
- Publisher
- The Japan Society of Applied Physics
- Citation
- 2003 International Microprocesses and Nanotechnology Conference
- Conference Name
- 2003 International Microprocesses and Nanotechnology Conference
- Place
- Tokyo, Japan
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.