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Properties of Si-based Nanostuructures Fabricated by PECVD and UHV Sputtering Methods

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dc.contributor.author김은규-
dc.date.accessioned2021-08-04T06:05:41Z-
dc.date.available2021-08-04T06:05:41Z-
dc.date.created2021-06-30-
dc.date.issued2003-09-24-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/74850-
dc.publisherQuantum Photonic Science Research Center-
dc.titleProperties of Si-based Nanostuructures Fabricated by PECVD and UHV Sputtering Methods-
dc.typeConference-
dc.contributor.affiliatedAuthor김은규-
dc.identifier.bibliographicCitation10th Korea-China Symposium on Thin Film Materials-
dc.relation.isPartOf10th Korea-China Symposium on Thin Film Materials-
dc.citation.title10th Korea-China Symposium on Thin Film Materials-
dc.citation.conferencePlaceSeoul-
dc.type.rimsCONF-
dc.description.journalClass1-
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서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers

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