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Performance of high k HfO2 gate oxide prepared by an inductively coupled rf sputtering system at room temperature

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dc.contributor.author홍진표-
dc.date.accessioned2021-08-04T06:39:57Z-
dc.date.available2021-08-04T06:39:57Z-
dc.date.issued2003-10-24-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/75853-
dc.titlePerformance of high k HfO2 gate oxide prepared by an inductively coupled rf sputtering system at room temperature-
dc.typeConference-
dc.citation.conferenceName2003년도 가을 학술논문발표회-
dc.citation.conferencePlace경북대-
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서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers

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