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Deconvolution of Scanning Acoustic Microscope Ultrasonic Signals using Wavelet Transforms to Inspect Semiconductor Die Bonds
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 장경영 | - |
| dc.date.accessioned | 2021-08-04T09:36:12Z | - |
| dc.date.available | 2021-08-04T09:36:12Z | - |
| dc.date.issued | 2000-07-17 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/80332 | - |
| dc.title | Deconvolution of Scanning Acoustic Microscope Ultrasonic Signals using Wavelet Transforms to Inspect Semiconductor Die Bonds | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2000 Annual Conference of QNDE | - |
| dc.citation.conferencePlace | Iowa, USA | - |
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Collections - 서울 공과대학 > 서울 기계공학부 > 2. Conference Papers
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