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Deconvolution of Scanning Acoustic Microscope Ultrasonic Signals using Wavelet Transforms to Inspect Semiconductor Die Bonds
- Authors
- 장경영
- Issue Date
- 17-Jul-2000
- Place
- Iowa, USA
- Conference Name
- 2000 Annual Conference of QNDE
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Collections - 서울 공과대학 > 서울 기계공학부 > 2. Conference Papers
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