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Sublayer thickness dependence of interfacial silicide formation in Fe/Si multilayered films
- Authors
- 남창우
- Issue Date
- 28-Apr-2000
- Conference Name
- 2000년도 봄 학술발표회
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Nahm, Tschang Uh
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)