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독립성분분석을 적용한 wafer bin map 결함패턴 분류 방법론 연구
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 배석주 | - |
| dc.date.accessioned | 2021-08-02T08:56:09Z | - |
| dc.date.available | 2021-08-02T08:56:09Z | - |
| dc.date.created | 2021-06-30 | - |
| dc.date.issued | 2020-07-06 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/9403 | - |
| dc.publisher | 한국품질경영학회 | - |
| dc.title | 독립성분분석을 적용한 wafer bin map 결함패턴 분류 방법론 연구 | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 배석주 | - |
| dc.identifier.bibliographicCitation | 2020 한국품질경영학회 춘계학술대회 | - |
| dc.relation.isPartOf | 2020 한국품질경영학회 춘계학술대회 | - |
| dc.citation.title | 2020 한국품질경영학회 춘계학술대회 | - |
| dc.citation.conferencePlace | 더케이호텔 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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Collections - 서울 공과대학 > 서울 산업공학과 > 2. Conference Papers
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Related Researcher
- Bae, Suk Joo
- COLLEGE OF ENGINEERING (DEPARTMENT OF INDUSTRIAL ENGINEERING)